mtd: nand: scan 1st and 2nd page for Macronix SLC
Signed-off-by: Brian Norris <computersforpeace@gmail.com>
Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@linux.intel.com>
Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
diff --git a/drivers/mtd/nand/nand_base.c b/drivers/mtd/nand/nand_base.c
index 3ed9c5e..35b4565 100644
--- a/drivers/mtd/nand/nand_base.c
+++ b/drivers/mtd/nand/nand_base.c
@@ -3132,8 +3132,8 @@
* Bad block marker is stored in the last page of each block
* on Samsung and Hynix MLC devices; stored in first two pages
* of each block on Micron devices with 2KiB pages and on
- * SLC Samsung, Hynix, Toshiba and AMD/Spansion. All others scan
- * only the first page.
+ * SLC Samsung, Hynix, Toshiba, AMD/Spansion, and Macronix.
+ * All others scan only the first page.
*/
if ((chip->cellinfo & NAND_CI_CELLTYPE_MSK) &&
(*maf_id == NAND_MFR_SAMSUNG ||
@@ -3143,7 +3143,8 @@
(*maf_id == NAND_MFR_SAMSUNG ||
*maf_id == NAND_MFR_HYNIX ||
*maf_id == NAND_MFR_TOSHIBA ||
- *maf_id == NAND_MFR_AMD)) ||
+ *maf_id == NAND_MFR_AMD ||
+ *maf_id == NAND_MFR_MACRONIX)) ||
(mtd->writesize == 2048 &&
*maf_id == NAND_MFR_MICRON))
chip->bbt_options |= NAND_BBT_SCAN2NDPAGE;
