| /* SPDX-License-Identifier: GPL-2.0-only */ |
| /* |
| * Copyright (C) 2007-2009 ST-Ericsson AB |
| * |
| * ABX500 core access functions. |
| * The abx500 interface is used for the Analog Baseband chips. |
| * |
| * Author: Mattias Wallin <mattias.wallin@stericsson.com> |
| * Author: Mattias Nilsson <mattias.i.nilsson@stericsson.com> |
| * Author: Bengt Jonsson <bengt.g.jonsson@stericsson.com> |
| * Author: Rickard Andersson <rickard.andersson@stericsson.com> |
| */ |
| |
| #include <linux/regulator/machine.h> |
| |
| struct device; |
| |
| #ifndef MFD_ABX500_H |
| #define MFD_ABX500_H |
| |
| /** |
| * struct abx500_init_setting |
| * Initial value of the registers for driver to use during setup. |
| */ |
| struct abx500_init_settings { |
| u8 bank; |
| u8 reg; |
| u8 setting; |
| }; |
| |
| /* Battery driver related data */ |
| /* |
| * ADC for the battery thermistor. |
| * When using the ABx500_ADC_THERM_BATCTRL the battery ID resistor is combined |
| * with a NTC resistor to both identify the battery and to measure its |
| * temperature. Different phone manufactures uses different techniques to both |
| * identify the battery and to read its temperature. |
| */ |
| enum abx500_adc_therm { |
| ABx500_ADC_THERM_BATCTRL, |
| ABx500_ADC_THERM_BATTEMP, |
| }; |
| |
| /** |
| * struct abx500_res_to_temp - defines one point in a temp to res curve. To |
| * be used in battery packs that combines the identification resistor with a |
| * NTC resistor. |
| * @temp: battery pack temperature in Celsius |
| * @resist: NTC resistor net total resistance |
| */ |
| struct abx500_res_to_temp { |
| int temp; |
| int resist; |
| }; |
| |
| /** |
| * struct abx500_v_to_cap - Table for translating voltage to capacity |
| * @voltage: Voltage in mV |
| * @capacity: Capacity in percent |
| */ |
| struct abx500_v_to_cap { |
| int voltage; |
| int capacity; |
| }; |
| |
| /* Forward declaration */ |
| struct abx500_fg; |
| |
| /** |
| * struct abx500_fg_parameters - Fuel gauge algorithm parameters, in seconds |
| * if not specified |
| * @recovery_sleep_timer: Time between measurements while recovering |
| * @recovery_total_time: Total recovery time |
| * @init_timer: Measurement interval during startup |
| * @init_discard_time: Time we discard voltage measurement at startup |
| * @init_total_time: Total init time during startup |
| * @high_curr_time: Time current has to be high to go to recovery |
| * @accu_charging: FG accumulation time while charging |
| * @accu_high_curr: FG accumulation time in high current mode |
| * @high_curr_threshold: High current threshold, in mA |
| * @lowbat_threshold: Low battery threshold, in mV |
| * @overbat_threshold: Over battery threshold, in mV |
| * @battok_falling_th_sel0 Threshold in mV for battOk signal sel0 |
| * Resolution in 50 mV step. |
| * @battok_raising_th_sel1 Threshold in mV for battOk signal sel1 |
| * Resolution in 50 mV step. |
| * @user_cap_limit Capacity reported from user must be within this |
| * limit to be considered as sane, in percentage |
| * points. |
| * @maint_thres This is the threshold where we stop reporting |
| * battery full while in maintenance, in per cent |
| * @pcut_enable: Enable power cut feature in ab8505 |
| * @pcut_max_time: Max time threshold |
| * @pcut_flag_time: Flagtime threshold |
| * @pcut_max_restart: Max number of restarts |
| * @pcut_debounce_time: Sets battery debounce time |
| */ |
| struct abx500_fg_parameters { |
| int recovery_sleep_timer; |
| int recovery_total_time; |
| int init_timer; |
| int init_discard_time; |
| int init_total_time; |
| int high_curr_time; |
| int accu_charging; |
| int accu_high_curr; |
| int high_curr_threshold; |
| int lowbat_threshold; |
| int overbat_threshold; |
| int battok_falling_th_sel0; |
| int battok_raising_th_sel1; |
| int user_cap_limit; |
| int maint_thres; |
| bool pcut_enable; |
| u8 pcut_max_time; |
| u8 pcut_flag_time; |
| u8 pcut_max_restart; |
| u8 pcut_debounce_time; |
| }; |
| |
| /** |
| * struct abx500_charger_maximization - struct used by the board config. |
| * @use_maxi: Enable maximization for this battery type |
| * @maxi_chg_curr: Maximum charger current allowed |
| * @maxi_wait_cycles: cycles to wait before setting charger current |
| * @charger_curr_step delta between two charger current settings (mA) |
| */ |
| struct abx500_maxim_parameters { |
| bool ena_maxi; |
| int chg_curr; |
| int wait_cycles; |
| int charger_curr_step; |
| }; |
| |
| /** |
| * struct abx500_battery_type - different batteries supported |
| * @name: battery technology |
| * @resis_high: battery upper resistance limit |
| * @resis_low: battery lower resistance limit |
| * @charge_full_design: Maximum battery capacity in mAh |
| * @nominal_voltage: Nominal voltage of the battery in mV |
| * @termination_vol: max voltage upto which battery can be charged |
| * @termination_curr battery charging termination current in mA |
| * @recharge_cap battery capacity limit that will trigger a new |
| * full charging cycle in the case where maintenan- |
| * -ce charging has been disabled |
| * @normal_cur_lvl: charger current in normal state in mA |
| * @normal_vol_lvl: charger voltage in normal state in mV |
| * @maint_a_cur_lvl: charger current in maintenance A state in mA |
| * @maint_a_vol_lvl: charger voltage in maintenance A state in mV |
| * @maint_a_chg_timer_h: charge time in maintenance A state |
| * @maint_b_cur_lvl: charger current in maintenance B state in mA |
| * @maint_b_vol_lvl: charger voltage in maintenance B state in mV |
| * @maint_b_chg_timer_h: charge time in maintenance B state |
| * @low_high_cur_lvl: charger current in temp low/high state in mA |
| * @low_high_vol_lvl: charger voltage in temp low/high state in mV' |
| * @battery_resistance: battery inner resistance in mOhm. |
| * @n_r_t_tbl_elements: number of elements in r_to_t_tbl |
| * @r_to_t_tbl: table containing resistance to temp points |
| * @n_v_cap_tbl_elements: number of elements in v_to_cap_tbl |
| * @v_to_cap_tbl: Voltage to capacity (in %) table |
| * @n_batres_tbl_elements number of elements in the batres_tbl |
| * @batres_tbl battery internal resistance vs temperature table |
| */ |
| struct abx500_battery_type { |
| int name; |
| int resis_high; |
| int resis_low; |
| int charge_full_design; |
| int nominal_voltage; |
| int termination_vol; |
| int termination_curr; |
| int recharge_cap; |
| int normal_cur_lvl; |
| int normal_vol_lvl; |
| int maint_a_cur_lvl; |
| int maint_a_vol_lvl; |
| int maint_a_chg_timer_h; |
| int maint_b_cur_lvl; |
| int maint_b_vol_lvl; |
| int maint_b_chg_timer_h; |
| int low_high_cur_lvl; |
| int low_high_vol_lvl; |
| int battery_resistance; |
| int n_temp_tbl_elements; |
| const struct abx500_res_to_temp *r_to_t_tbl; |
| int n_v_cap_tbl_elements; |
| const struct abx500_v_to_cap *v_to_cap_tbl; |
| int n_batres_tbl_elements; |
| const struct batres_vs_temp *batres_tbl; |
| }; |
| |
| /** |
| * struct abx500_bm_capacity_levels - abx500 capacity level data |
| * @critical: critical capacity level in percent |
| * @low: low capacity level in percent |
| * @normal: normal capacity level in percent |
| * @high: high capacity level in percent |
| * @full: full capacity level in percent |
| */ |
| struct abx500_bm_capacity_levels { |
| int critical; |
| int low; |
| int normal; |
| int high; |
| int full; |
| }; |
| |
| /** |
| * struct abx500_bm_charger_parameters - Charger specific parameters |
| * @usb_volt_max: maximum allowed USB charger voltage in mV |
| * @usb_curr_max: maximum allowed USB charger current in mA |
| * @ac_volt_max: maximum allowed AC charger voltage in mV |
| * @ac_curr_max: maximum allowed AC charger current in mA |
| */ |
| struct abx500_bm_charger_parameters { |
| int usb_volt_max; |
| int usb_curr_max; |
| int ac_volt_max; |
| int ac_curr_max; |
| }; |
| |
| /** |
| * struct abx500_bm_data - abx500 battery management data |
| * @temp_under under this temp, charging is stopped |
| * @temp_low between this temp and temp_under charging is reduced |
| * @temp_high between this temp and temp_over charging is reduced |
| * @temp_over over this temp, charging is stopped |
| * @temp_now present battery temperature |
| * @temp_interval_chg temperature measurement interval in s when charging |
| * @temp_interval_nochg temperature measurement interval in s when not charging |
| * @main_safety_tmr_h safety timer for main charger |
| * @usb_safety_tmr_h safety timer for usb charger |
| * @bkup_bat_v voltage which we charge the backup battery with |
| * @bkup_bat_i current which we charge the backup battery with |
| * @no_maintenance indicates that maintenance charging is disabled |
| * @capacity_scaling indicates whether capacity scaling is to be used |
| * @abx500_adc_therm placement of thermistor, batctrl or battemp adc |
| * @chg_unknown_bat flag to enable charging of unknown batteries |
| * @enable_overshoot flag to enable VBAT overshoot control |
| * @auto_trig flag to enable auto adc trigger |
| * @fg_res resistance of FG resistor in 0.1mOhm |
| * @n_btypes number of elements in array bat_type |
| * @batt_id index of the identified battery in array bat_type |
| * @interval_charging charge alg cycle period time when charging (sec) |
| * @interval_not_charging charge alg cycle period time when not charging (sec) |
| * @temp_hysteresis temperature hysteresis |
| * @gnd_lift_resistance Battery ground to phone ground resistance (mOhm) |
| * @n_chg_out_curr number of elements in array chg_output_curr |
| * @n_chg_in_curr number of elements in array chg_input_curr |
| * @chg_output_curr charger output current level map |
| * @chg_input_curr charger input current level map |
| * @maxi maximization parameters |
| * @cap_levels capacity in percent for the different capacity levels |
| * @bat_type table of supported battery types |
| * @chg_params charger parameters |
| * @fg_params fuel gauge parameters |
| */ |
| struct abx500_bm_data { |
| int temp_under; |
| int temp_low; |
| int temp_high; |
| int temp_over; |
| int temp_now; |
| int temp_interval_chg; |
| int temp_interval_nochg; |
| int main_safety_tmr_h; |
| int usb_safety_tmr_h; |
| int bkup_bat_v; |
| int bkup_bat_i; |
| bool autopower_cfg; |
| bool ac_enabled; |
| bool usb_enabled; |
| bool no_maintenance; |
| bool capacity_scaling; |
| bool chg_unknown_bat; |
| bool enable_overshoot; |
| bool auto_trig; |
| enum abx500_adc_therm adc_therm; |
| int fg_res; |
| int n_btypes; |
| int batt_id; |
| int interval_charging; |
| int interval_not_charging; |
| int temp_hysteresis; |
| int gnd_lift_resistance; |
| int n_chg_out_curr; |
| int n_chg_in_curr; |
| int *chg_output_curr; |
| int *chg_input_curr; |
| const struct abx500_maxim_parameters *maxi; |
| const struct abx500_bm_capacity_levels *cap_levels; |
| struct abx500_battery_type *bat_type; |
| const struct abx500_bm_charger_parameters *chg_params; |
| const struct abx500_fg_parameters *fg_params; |
| }; |
| |
| enum { |
| NTC_EXTERNAL = 0, |
| NTC_INTERNAL, |
| }; |
| |
| int ab8500_bm_of_probe(struct device *dev, |
| struct device_node *np, |
| struct abx500_bm_data *bm); |
| |
| int abx500_set_register_interruptible(struct device *dev, u8 bank, u8 reg, |
| u8 value); |
| int abx500_get_register_interruptible(struct device *dev, u8 bank, u8 reg, |
| u8 *value); |
| int abx500_get_register_page_interruptible(struct device *dev, u8 bank, |
| u8 first_reg, u8 *regvals, u8 numregs); |
| int abx500_set_register_page_interruptible(struct device *dev, u8 bank, |
| u8 first_reg, u8 *regvals, u8 numregs); |
| /** |
| * abx500_mask_and_set_register_inerruptible() - Modifies selected bits of a |
| * target register |
| * |
| * @dev: The AB sub device. |
| * @bank: The i2c bank number. |
| * @bitmask: The bit mask to use. |
| * @bitvalues: The new bit values. |
| * |
| * Updates the value of an AB register: |
| * value -> ((value & ~bitmask) | (bitvalues & bitmask)) |
| */ |
| int abx500_mask_and_set_register_interruptible(struct device *dev, u8 bank, |
| u8 reg, u8 bitmask, u8 bitvalues); |
| int abx500_get_chip_id(struct device *dev); |
| int abx500_event_registers_startup_state_get(struct device *dev, u8 *event); |
| int abx500_startup_irq_enabled(struct device *dev, unsigned int irq); |
| |
| struct abx500_ops { |
| int (*get_chip_id) (struct device *); |
| int (*get_register) (struct device *, u8, u8, u8 *); |
| int (*set_register) (struct device *, u8, u8, u8); |
| int (*get_register_page) (struct device *, u8, u8, u8 *, u8); |
| int (*set_register_page) (struct device *, u8, u8, u8 *, u8); |
| int (*mask_and_set_register) (struct device *, u8, u8, u8, u8); |
| int (*event_registers_startup_state_get) (struct device *, u8 *); |
| int (*startup_irq_enabled) (struct device *, unsigned int); |
| void (*dump_all_banks) (struct device *); |
| }; |
| |
| int abx500_register_ops(struct device *core_dev, struct abx500_ops *ops); |
| void abx500_remove_ops(struct device *dev); |
| #endif |
