blob: 1e6273d815759d9c10978ae9af6c9285068b6bde [file] [log] [blame]
/* SPDX-License-Identifier: GPL-2.0 */
/* Copyright (C) 2019 ARM Limited */
#ifndef __TEST_SIGNALS_H__
#define __TEST_SIGNALS_H__
#include <signal.h>
#include <stdbool.h>
#include <ucontext.h>
/*
* Using ARCH specific and sanitized Kernel headers from the tree.
*/
#include <asm/ptrace.h>
#include <asm/hwcap.h>
#define __stringify_1(x...) #x
#define __stringify(x...) __stringify_1(x)
#define get_regval(regname, out) \
{ \
asm volatile("mrs %0, " __stringify(regname) \
: "=r" (out) \
: \
: "memory"); \
}
/*
* Feature flags used in tdescr.feats_required to specify
* any feature by the test
*/
enum {
FSSBS_BIT,
FSVE_BIT,
FSME_BIT,
FSME_FA64_BIT,
FSME2_BIT,
FMAX_END
};
#define FEAT_SSBS (1UL << FSSBS_BIT)
#define FEAT_SVE (1UL << FSVE_BIT)
#define FEAT_SME (1UL << FSME_BIT)
#define FEAT_SME_FA64 (1UL << FSME_FA64_BIT)
#define FEAT_SME2 (1UL << FSME2_BIT)
/*
* A descriptor used to describe and configure a test case.
* Fields with a non-trivial meaning are described inline in the following.
*/
struct tdescr {
/* KEEP THIS FIELD FIRST for easier lookup from assembly */
void *token;
/* when disabled token based sanity checking is skipped in handler */
bool sanity_disabled;
/* just a name for the test-case; manadatory field */
char *name;
char *descr;
unsigned long feats_required;
unsigned long feats_incompatible;
/* bitmask of effectively supported feats: populated at run-time */
unsigned long feats_supported;
bool initialized;
unsigned int minsigstksz;
/* signum used as a test trigger. Zero if no trigger-signal is used */
int sig_trig;
/*
* signum considered as a successful test completion.
* Zero when no signal is expected on success
*/
int sig_ok;
/* signum expected on unsupported CPU features. */
int sig_unsupp;
/* a timeout in second for test completion */
unsigned int timeout;
bool triggered;
bool pass;
unsigned int result;
/* optional sa_flags for the installed handler */
int sa_flags;
ucontext_t saved_uc;
/* used by get_current_ctx() */
size_t live_sz;
ucontext_t *live_uc;
volatile sig_atomic_t live_uc_valid;
/* optional test private data */
void *priv;
/* a custom setup: called alternatively to default_setup */
int (*setup)(struct tdescr *td);
/* a custom init: called by default test init after test_setup */
bool (*init)(struct tdescr *td);
/* a custom cleanup function called before test exits */
void (*cleanup)(struct tdescr *td);
/* an optional function to be used as a trigger for starting test */
int (*trigger)(struct tdescr *td);
/*
* the actual test-core: invoked differently depending on the
* presence of the trigger function above; this is mandatory
*/
int (*run)(struct tdescr *td, siginfo_t *si, ucontext_t *uc);
/* an optional function for custom results' processing */
void (*check_result)(struct tdescr *td);
};
extern struct tdescr tde;
#endif