| # SPDX-License-Identifier: (GPL-2.0-only OR BSD-2-Clause) |
| %YAML 1.2 |
| --- |
| $id: http://devicetree.org/schemas/hwmon/adi,ltc4282.yaml# |
| $schema: http://devicetree.org/meta-schemas/core.yaml# |
| |
| title: Analog Devices LTC4282 I2C High Current Hot Swap Controller over I2C |
| |
| maintainers: |
| - Nuno Sa <nuno.sa@analog.com> |
| |
| description: | |
| Analog Devices LTC4282 I2C High Current Hot Swap Controller over I2C. |
| |
| https://www.analog.com/media/en/technical-documentation/data-sheets/ltc4282.pdf |
| |
| properties: |
| compatible: |
| enum: |
| - adi,ltc4282 |
| |
| reg: |
| maxItems: 1 |
| |
| vdd-supply: true |
| |
| clocks: |
| maxItems: 1 |
| |
| '#clock-cells': |
| const: 0 |
| |
| adi,rsense-nano-ohms: |
| description: Value of the sense resistor. |
| |
| adi,vin-mode-microvolt: |
| description: |
| Selects operating range for the Undervoltage, Overvoltage and Foldback |
| pins. Also for the ADC. Should be set to the nominal input voltage. |
| enum: [3300000, 5000000, 12000000, 24000000] |
| default: 12000000 |
| |
| adi,fet-bad-timeout-ms: |
| description: |
| From the moment a FET bad conditions is present, this property selects the |
| wait time/timeout for a FET-bad fault to be signaled. Setting this to 0, |
| disables FET bad faults to be reported. |
| default: 255 |
| maximum: 255 |
| |
| adi,overvoltage-dividers: |
| description: | |
| Select which dividers to use for VDD Overvoltage detection. Note that |
| when the internal dividers are used the threshold is referenced to VDD. |
| The percentages in the datasheet are misleading since the actual values |
| to look for are in the "Absolute Maximum Ratings" table in the |
| "Comparator Inputs" section. In there there's a line for each of the 5%, |
| 10% and 15% settings with the actual min, typical and max tolerances. |
| $ref: /schemas/types.yaml#/definitions/string |
| enum: [external, vdd_5_percent, vdd_10_percent, vdd_15_percent] |
| default: external |
| |
| adi,undervoltage-dividers: |
| description: | |
| Select which dividers to use for VDD Overvoltage detection. Note that |
| when the internal dividers are used the threshold is referenced to VDD. |
| The percentages in the datasheet are misleading since the actual values |
| to look for are in the "Absolute Maximum Ratings" table in the |
| "Comparator Inputs" section. In there there's a line for each of the 5%, |
| 10% and 15% settings with the actual min, typical and max tolerances. |
| $ref: /schemas/types.yaml#/definitions/string |
| enum: [external, vdd_5_percent, vdd_10_percent, vdd_15_percent] |
| default: external |
| |
| adi,current-limit-sense-microvolt: |
| description: |
| The current limit sense voltage of the chip is adjustable between |
| 12.5mV and 34.4mV in 3.1mV steps. This effectively limits the current |
| on the load. |
| enum: [12500, 15625, 18750, 21875, 25000, 28125, 31250, 34375] |
| default: 25000 |
| |
| adi,overcurrent-retry: |
| description: |
| If set, enables the chip to auto-retry 256 timer cycles after an |
| Overcurrent fault. |
| type: boolean |
| |
| adi,overvoltage-retry-disable: |
| description: |
| If set, disables the chip to auto-retry 50ms after an Overvoltage fault. |
| It's enabled by default. |
| type: boolean |
| |
| adi,undervoltage-retry-disable: |
| description: |
| If set, disables the chip to auto-retry 50ms after an Undervoltage fault. |
| It's enabled by default. |
| type: boolean |
| |
| adi,fault-log-enable: |
| description: |
| If set, enables the FAULT_LOG and ADC_ALERT_LOG registers to be written |
| to the EEPROM when a fault bit transitions high and hence, will be |
| available after a power cycle (the chip loads the contents of |
| the EE_FAULT_LOG register - the one in EEPROM - into FAULT_LOG at boot). |
| type: boolean |
| |
| adi,gpio1-mode: |
| description: Defines the function of the Pin. It can indicate that power is |
| good (PULL the pin low when power is not good) or that power is bad (Go |
| into high-z when power is not good). |
| $ref: /schemas/types.yaml#/definitions/string |
| enum: [power_bad, power_good] |
| default: power_good |
| |
| adi,gpio2-mode: |
| description: Defines the function of the Pin. It can be set as the input for |
| the ADC or indicating that the MOSFET is in stress (dissipating power). |
| $ref: /schemas/types.yaml#/definitions/string |
| enum: [adc_input, stress_fet] |
| default: adc_input |
| |
| adi,gpio3-monitor-enable: |
| description: If set, gpio3 is set as input for the ADC instead of gpio2. |
| type: boolean |
| |
| allOf: |
| - if: |
| required: |
| - adi,gpio3-monitor-enable |
| then: |
| properties: |
| adi,gpio2-mode: |
| const: stress_fet |
| |
| required: |
| - compatible |
| - reg |
| - adi,rsense-nano-ohms |
| |
| additionalProperties: false |
| |
| examples: |
| - | |
| i2c { |
| #address-cells = <1>; |
| #size-cells = <0>; |
| |
| hwmon@50 { |
| compatible = "adi,ltc4282"; |
| reg = <0x50>; |
| adi,rsense-nano-ohms = <500>; |
| |
| adi,gpio1-mode = "power_good"; |
| adi,gpio2-mode = "adc_input"; |
| }; |
| }; |
| ... |