blob: 600658e33bec729155126317a2b97b7d7938363e [file] [log] [blame]
/* SPDX-License-Identifier: GPL-2.0 */
/* Copyright (c) 2020 Intel Corporation */
bool igc_reg_test(struct igc_adapter *adapter, u64 *data);
bool igc_eeprom_test(struct igc_adapter *adapter, u64 *data);
bool igc_link_test(struct igc_adapter *adapter, u64 *data);
struct igc_reg_test {
u16 reg;
u8 array_len;
u8 test_type;
u32 mask;
u32 write;
/* In the hardware, registers are laid out either singly, in arrays
* spaced 0x40 bytes apart, or in contiguous tables. We assume
* most tests take place on arrays or single registers (handled
* as a single-element array) and special-case the tables.
* Table tests are always pattern tests.
* We also make provision for some required setup steps by specifying
* registers to be written without any read-back testing.
#define PATTERN_TEST 1
#define SET_READ_TEST 2
#define TABLE32_TEST 3
#define TABLE64_TEST_LO 4
#define TABLE64_TEST_HI 5